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Test Forum​

 

Extend Horizon of Test Technology

  • Date: Thursday, February 9, 2017
  • Time: 13:00-17:00
  • Room: #318, Conference Room (South), COEX
  • Language: English and Korean (Simultaneous interpretation will NOT be provided)

 

Registration Fee  
  SEMI Member Non-Member Student
Pre-regi(by Feb 1) 120,000 won 150,000 won 60,000 won
Onsite 150,000 won 180,000 won 80,000 won

 

 

Sponsored by

 

 

 

 

Committee 
James JinSoo Ko (Teradyne) 
Minhyun Kwon (SK hynix)
Im Jong Park (Formfactor Korea)
Kwonsung Ban (Samsung Electronics)
Kyu-hyuk Yeon (ASE Korea)
MinHo Chang (Amkor Technology Korea)
Jeongho Cho (Advantest Korea)

 

Agenda

13:00-13:30 New Test Flow Challenges in Semiconductor Test
  Ken Lanier, Teradyne
   
13:30-14:00 TBD
  Stephen Pruitt, Teradyne
   
14:00-14:30 Challenges to Test IoT Modules on ATE System
  Jeongseob Kim, Advantest Korea
   
14:30-14:50 Break
   
14:50-16:30 Using OEE Data to Drive Manufacturing Excellence at Test
  Dale Ohmart, Texas Instruments
   
16:30-17:00 Cost of Test Optimization for WLP High Volume QA Testing
  Serge Kuenzli, COHU

 

*The agenda will be subject to change without notice.

*Presentation materials only for agreed by speaker will be distributed via website after the events.

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