02-531-7800

Korean


테스트포럼

Room #318, COEX Wednesday, January 31
1:00pm to 5:00pm

Extend Horizon of Test Technology

등록비

  SEMI Member Non-Member Student
Pre-regi(by Feb 1) 120,000 won 150,000 won 60,000 won
Onsite 150,000 won 180,000 won 80,000 won

Register

Committee

  • James JinSoo Ko (Teradyne)
  • Minhyun Kwon (SK hynix)
  • Im Jong Park (Formfactor Korea)
  • Kwonsung Ban (Samsung Electronics)
  • Kyu-hyuk Yeon (ASE Korea)
  • MinHo Chang (Amkor Technology Korea)
  • Jeongho Cho (Advantest Korea)

아젠다

13:00-13:30 New Test Flow Challenges in Semiconductor Test
  Ken Lanier, Teradyne
   
13:30-14:00 5G Cellular and the mmWave Testing Challenge
  Stephen Pruitt, Teradyne
   
14:00-14:30 The Challenges of Testing IoT Modules on ATE Systems
  Jeongseob Kim, Advantest Korea
   
14:30-14:50 Break
   
14:50-16:30 Using OEE Data to Drive Manufacturing Excellence at Test
  Dale Ohmart, Texas Instruments
   
16:30-17:00 Cost of Test Optimization for WLP High Volume QA Testing
  Serge Kuenzli, COHU

*상기 일정은 사전 안내 없이 변경될 수 있습니다.

*발표 자료는 당일 컨퍼런스 종료 후 사이트를 통해 배포됩니다 (연사가 동의하지 않는 경우는 배포되지 않음).

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