02-531-7800

Korean


테스트포럼

Room 318, COEX Thursday, January 24
1:00pm to 4:20pm

The 5G and Big Data, key issues in next connected world are increasing demand for putting more pressure on test costs due to higher coverage requirements. Test must become smarter to address the increased quality demands, while at the same time remaining economical. To address these challenges, test industry is struggling with increasing instrumentation integration, smarter strategies, self-test, adaptive test, system-level test, as well as more sophisticated test hardware. In this Test Forum, you can get the clues to overcome these challenges from industry expertise.
 
  • 날짜: 2019년 1월 24일(목)
  • 시간: 13:00-16:20
  • 장소: 코엑스 3층 318호
  • 언어: 영어/한국어 (동시통역은 제공되지 않습니다.)

 

Committee

  • Young-Kwan Ko (UniTest)
  • James Jin-Soo Ko (Teradyne Korea)
  • Hyuk Kwon (Advantest Korea)
  • Kwonsung Ban (Samsung Electronics)
  • JeongBeom Bae (FormFactor Korea)
  • Sokyoung Song (SK hynix)
  • Kyu-hyuk Yeon (ASE Korea)
  • MinHo Chang (Amkor Technology Korea)
  • YH Jeon (TSE)
  • SungSoo Chung (QRT)

 

등록비

  SEMI 회원사 비회원사 학생
사전등록(1/16까지) 150,000 원 180,000 원 80,000 원
현장등록 180,000 원 200,000 원 100,000 원

 

아젠다

 
 
13:00-13:30
TBD
 
Gregory Smith, Teradyne
 
 
13:30-14:00
Automotive Semiconductor Testing
 
 
 
14:00-14:30
Testing Challenges and Design for Reliability
 
 
 
14:30-14:50
Break
 
 
14:50-15:20
RF Test Challenges Posed by the 5G Production Rollout
 
Kriss Hublitz, MaxLinear
 
 
15:20-15:50
Challenges of AI Testing
 
 
 
15:50-16:20
A New Singulated HBM Testing Solution - Breakthrough from Traditional ATE Test Method
 
 
 
*상기일정은 사전 안내 없이 변경될 수 있습니다. 
*발표자료는 연사동의를 받은 자료에 한하여 행사 이후 이메일로 다운로드 방법을 안내드립니다.
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