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Test Forum

Wednesday, February 5 | 1:00 pm - 4:50 pm

The 5G and AI, key issues in the next connected world are increasing demand for putting more pressure on test costs due to higher coverage requirements. Test must become smarter to address the increased quality demands, while at the same time remaining low cost of test. To address these challenges, test industry is struggling with increasing highly accurate and flexible instrumentation integration, smarter strategies, self-test, adaptive test, system-level test, as well as more sophisticated test hardware. 

In this Test Forum, you can get the clues to overcome these challenges from industry expertise.


  • Date: Feb 5(Wed), 2020
  • Time: 1:00 pm -  4:50 pm
  • Room: #318, Conference Room (South), COEX
  • Language: English and Korean (Simultaneous interpretation will NOT be provided.)



  • Young-Kwan Ko (UniTest)
  • James Jin-Soo Ko (Teradyne Korea)
  • Hyuk Kwon (Advantest Korea)
  • JeongBeom Bae (FormFactor Korea)
  • Sokyoung Song (SK hynix)
  • Kyu-hyuk Yeon (ASE Korea)
  • MinHo Chang (Amkor Technology Korea)
  • YH Jeon (TSE)
  • SungSoo Chung (QRT)


Registration Fee

  SEMI Member Non-Member Student
Early Bird (by Jan 29) 150,000 won 180,000 won 80,000 won
Onsite 180,000 won 200,000 won 100,000 won


AI and new Test Technology

Gregory Smith

1:00 pm - 1:30 pm

5G Networking System and Device SLT Testing

Rex Chen

1:30 pm - 2:00 pm

Achieve the balance of test cost, coverage and complexity of Advanced Packages and HBM

Quay Nhin

2:00 pm - 2:30 pm


2:30 pm - 2:50 pm

5G RF Test

Adrian Kwan

2:50 pm - 3:20 pm

Silicon Photonics (AI data center)

3:20 pm - 3:50 pm

High Speed Wafer Level Testing

3:50 pm - 4:20 pm

The Enhancement of Logic SCAN Diagnostics Using Machine Learning Technique for the Fast Yield Ramp Up

Jeongsu Park

4:20 pm - 4:50 pm