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Radiation Test of Advanced Device for Automotive Application

오후 3:50 - 오후 4:20

Automotive Functional Safety Standard and new generation of Telecommunication Equipment Standard mandate radiation test for all devices used in the design.

There are industry wide demands for Soft Error related reliability improvement effort here in Korea and abroad. The requirements were distant and limited practice only to aerospace and military until recent years, now the things has changed as the final version of ISO 26262-2018 Functional Safety Standard was released the last year December.

The presentation would like to review E/E/E/E parts in the road vehicle and the telecommunication equipment, their requirement, difficulties in conducting the test, and the cost of test compared with traditional intrinsic failure dependent test.

The presentation compares Extrinsic Reliability with Intrinsic Reliability related test practices and requirements and addresses impending HomeWorks each foundry and the advance device and system integrators must consider.

Lastly the presentation would like to address how wider communities try to address the issues and coping with challenges.

Speaker

Sung S. Chung

Sung S. Chung

CTO, QRT

Sung S. Chung (IEEE Life Member since 2018) received B.S. degree in Electronics Engineering from Sungkunkwan University, Seoul, Korea, in 1978 and M.S. degree in Electrical Engineering from Florida Institute of Technology, Melbourne, FL in 1984.

He spent 15 and a half years at Cisco Systems Inc., San Jose, CA. In recent years,  joined Hanyang University as a Research Professor for 3 years, lecturing and researching in the area of SiP/TSV test technology, Single Event Upset (SEU) and SoC reliability. Sung is now working for QRT Inc., Korea as a CTO since May 2017 until now.

He served many IEEE and JEDEC Test Standards working group member and holds 17 U.S. and Korean patents in the area of test and test technologies. Sung has contributed over 40+ technical papers and participated in various technical conferences as a keynote and invited speaker in the area of scan test, logic & memory BIST, and radfiation test and SEU mitigation.