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5G NR Semiconductor Test Challenges

오후 2:50 - 오후 3:20

The path of 5G adoption is complex due to the new opportunities and challenges that abound for mobile network operators, infrastructure providers, device manufacturers and end-users.

Some cities and countries started deploying 5G sub-6GHz and mmWave infrastructure in 2019 while 5G sub-6GHz mobile semiconductor devices have been deployed in 5G mobile phones since 2018.

For the higher frequency transceiver chips, the 5G mmWave AiP with integrated built-in phased array antenna packaging will be the mainstream devices of the future. These devices will require a different set of test methodologies using Over-the-Air measurement capabilities.

The entire semiconductor industry is learning from the initial 5G NR mmWave deployments, discovering the new test challenges ahead, and identifying innovative ways to test these types of devices with more effective test methodologies, which will result in a reduced Cost Model and significantly improved Time-to-Market cycle.

This session will cover the test context challenges faced by the semiconductor industry and innovative yet practical approaches to address these challenges.

Speaker

Sungjong Park

Sungjong Park

RF Test Engineer/Manager, Advantest

Sungjong Park joined Advantest Korea in 2011 and currently serves as an RF test engineer and manager. His responsibilities include local OSAT RF production support, RF training for customers, and RF and mmWave test development. Park has extensive experience developing RF applications such as PA, LNA, 3G/4G transceivers and 5G/mmWave devices. Prior to joining Advantest, he was an RF test development engineer at Amkor. During his seven years there, Park focused on local RF production test support and overseas RFIC test development. Park graduated from Dan-Kook University in Seoul with a Bachelor of Science degree in Electrical Engineering.