Sung S. Chung

Sung S. Chung (IEEE Life Member since 2018) received B.S. degree in Electronics Engineering from Sungkunkwan University, Seoul, Korea, in 1978 and M.S. degree in Electrical Engineering from Florida Institute of Technology, Melbourne, FL in 1984.

He spent 15 and a half years at Cisco Systems Inc., San Jose, CA. In recent years,  joined Hanyang University as a Research Professor for 3 years, lecturing and researching in the area of SiP/TSV test technology, Single Event Upset (SEU) and SoC reliability. Sung is now working for QRT Inc., Korea as a CTO since May 2017 until now.

He served many IEEE and JEDEC Test Standards working group member and holds 17 U.S. and Korean patents in the area of test and test technologies. Sung has contributed over 40+ technical papers and participated in various technical conferences as a keynote and invited speaker in the area of scan test, logic & memory BIST, and radfiation test and SEU mitigation.