Bryan Sang Hoon Lee

Bryan S. H. Lee Ph.D. works at Technology Development (TD) Group, Micron Technology (Boise, Idaho, USA) Previously, he worked at both FEI Company (Hillsboro, Oregon, USA) and Thermo Fisher Scientific (Hillsboro, Oregon, USA) developing Dual Beam (SEM-FIB) system solutions including, algorithms, applications, hardware, and software, for SEM-FIB performance enhancement, TEM analysis & SEM metrology, for 10 years. He is a member of TMS, awarded talks in TMS, published broad range of SCI journals, and holds substantial number of international patents commercialized in Dual Beam solutions & MI, has been in this field for 17+ years. Dr. Lee received PhD in Materials Science and Engineering, from The University of Texas at Dallas (USA) specializing in Focused Ion Beams (FIB) systems and implementing its broad applications.