Eunpa Kim

Eunpa Kim, Ph.D. is a Principal Engineer at Samsung Electronics since 2016 with responsibility of developing new metrology and inspection process for next-generation memory devices. Prior to this, he was a postdoctoral fellow at the University of California, Berkeley. He received his PhD degree in mechanical engineering from the University of California, Berkeley, in 2014. Kim’s research interests include micro-/nanoscale metrology and inspection for low-dimensional and multi-dimensional semiconducting nanomaterial and devices.