Dong Gun Kim
PL / Memory EDS Team, Samsung Electronics
Kim received a Bachelor's degree in Electrical Engineering from Korea University, Seoul, South Korea, 2003.
Kim received a Master's degree in Electrical Engineering from Korea University, Seoul, South Korea, 2005.
Kim is currently pursuing a Ph.D. in Mechanical Engineering at Seoul National University, Seoul, South Korea, 2023 - Present.
Dong Gun Kim has been working in the field of DRAM Wafer Test at SAMSUNG since 2005.
- Improve Wafer Test Productivity and Yield
- Develop Wafer High-Speed Test DFT and Methods
- Contribute to Tester Development with AdvanTest, YIKC, Teradyne company
- Conduct research in the field of Wafer Test Temperature Control