Taehun Lee

Taehun Lee, Ph.D works at Logic Technology Development (LTD) Failure Analysis(FA) group, Intel (Hillsboro, Oregon, USA). Dr. Lee earned his Ph.D. degree in Material Science and Engineering from the University of Texas at Dallas, specializing in nano-characterization, with a focus on advanced techniques using Transmission Electron Microscopy (TEM) and Focused Ion Beam (FIB) systems. His interest on advanced nano-scale characterization technique has begun while he was working on 3D tomography work during his Ph.D and it became a seed for innovating current state of art automated FA and metrology technique innovation at Intel.

A visionary in the field, Dr. Lee continues to lead and inspire, driving excellence in innovating High precision, high volume automated FA and metrology in technique in Logic Technology Development at Intel for 13 years. In 2024, Dr. Lee looks forward to sharing insights and experiences during the upcoming Semicon 2024 as a featured speaker. This is an excellent opportunity to gain valuable perspectives from a leader who has consistently demonstrated a commitment to innovation and excellence in the semiconductor industry.