Taeyong Jo
Project Leader for Metrology Technology Development, MI Technology Enabling Next-Generation Semiconductor Development / Principal Engineer, Samsung Electronics
Dr. “Taeyong Jo” joined Samsung Electronics in 2013, where he oversees 3D Metrology and Spectroscopy. Since joining the company, he has pioneered the development of three-dimensional measurement technology (OCD) leveraging machine learning and physics principles.
Before joining Samsung Electronics, Jo earned a doctorate in precision machinery from Seoul National University, where he acquired extensive academic and industrial expertise collaborating with Professor H.J. Pahk as a member of SNU Precision.
At Samsung Electronics' Mechatronics Research division, “Jo” is at the forefront of advancing next-generation MI (Metrology Inspection) technologies. His leadership drives the creation and evolution of state-of-the-art metrology innovations, shaping the landscape of future technology.