Alan Liao

Alan holds an M.S. degree in Analog Circuit Design and Analysis from Silicon Valley University (SJSU) and a B.S. degree in Electrical Engineering from the University of California, Los Angeles (UCLA). Alan has been probe card industry for more than 20 years, join FormFactor since August 2008 as design engineer designed 300mm full wafer contact probe card for LPDDR testing. During 2014, Alan joined in Probes BU product marketing group involved product development for automotive market, business develop on SoC market in Asia, high-speed probe card product for HBM KGD testing. Recent focus on HBM, advanced packaging and quantum computing IC test solution and business development. Committee member of Semicon West Test Vision Symposium and IEEE Heterogeneous Integration Testing Roadmap.