Serena Stephenson

Serena Stephenson, Ph.D. currently leads the Advanced Characterization and Fundamentals team in CMP R&D, Electronics & Imaging located in Newark, DE. Her team focuses on development of next generation measurement technologies, data management and modeling to support and accelerate product development and applications.

Serena has spent time working in several industries including consumer products, commodity chemical, polyethylene and most recently in CMP over the course of the past 20 years in roles at the interface of R&D and Manufacturing. Primary areas of technical expertise have been around online process analyzer development and implementation, supporting global manufacturing quality laboratories, high throughput formulation research, formulation and interfacial science, chemometric model development, and big data for process control and setting strategic improvement directions.

Stephenson receive a Ph.D. in Physical Chemistry from the University of California, Berkeley, USA and a B.A. in Chemistry from Carleton College in Northfield, MN, USA. She is Six Sigma Black Belt certified.